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Volumn 69, Issue 3, 2000, Pages 777-784
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Electronic structure and electrical conductivity of amorphous Si-Ti alloys manifesting the metal-insulator transition
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Author keywords
Amorphous Si Ti alloys; DV X cluster calculation; Electrical conductivity; Localization; Metal insulator transition; Variable range hopping; XPS and UPS
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Indexed keywords
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EID: 0034409770
PISSN: 00319015
EISSN: None
Source Type: Journal
DOI: 10.1143/JPSJ.69.777 Document Type: Article |
Times cited : (8)
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References (27)
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