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Volumn 69, Issue 3, 2000, Pages 777-784

Electronic structure and electrical conductivity of amorphous Si-Ti alloys manifesting the metal-insulator transition

Author keywords

Amorphous Si Ti alloys; DV X cluster calculation; Electrical conductivity; Localization; Metal insulator transition; Variable range hopping; XPS and UPS

Indexed keywords


EID: 0034409770     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.69.777     Document Type: Article
Times cited : (8)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.