YBaCuO uncooled microbolometer IRFPA

Sensors and Materials

Volumn 12, Issue 5, 2000, Pages 315-325

  Wada, Hideo ^a   Sone, Takanori ^b   Hata, Hisatoshi ^b   Nakaki, Yoshiyuki ^b   Kaneda, Osamu ^b   Ohta, Yasuaki ^b   Ueno, Masashi ^b   Kimata, Masafumi ^b  

^a Ministry of Defense   (Japan)

^b MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

Microbolometer; Thermal imaging; Uncooled infrared focal plane; YBaCuO film

Indexed keywords

EID: 0034357432     PISSN: 09144935     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

1. B. Meyer, R. Cannata, A. Stout, A. Gin, P. Taylor, E. Woodbury, J. Deffner and F. Ennerson: SPIE 2746 (1996) 13.
2. T. Breen, N. Butler, M. Kohin, C. A. Marshall, R. Murphy, T. Parker and R. Silva: SPIE 3379 (1998) 145.
3. W. Radford, D. Murphy, A. Finch, K. Hay, A. Kennedy, M. Ray, A. Sayed, J. Wyles, R. Wyles, J. Varesi, E. Moody and F. Cheung: SPIE 3698 (1999) 119.
4. J. L. Tissot, F. Rothan, C. Vedel, M. Vilain and J. J. Yon: SPIE 3379 (1998) 139.
5. P. C. Shan, Çelik-Butler, D. P. Butler and A. Jahanzeb: J. Appl. Phys. 78 (1995) 7334.
6. A. Jahanzeb, C. M. Travers, Z. Çelik-Butler, D. P. Butler and S. G. Tan: IEEE Trans. Electron Devices 44 (1997) 1795.
7. T. Ishikawa, M. Ueno, K. Endo, Y. Nakaki, H. Hata, T. Sone and M. Kimata: Opto-Electr. Rev. 7 (1999) 297.
8. C. Marshall, N. Butler, R. Blackwell, R. Murphy and T. Breen: SPIE 2746 (1996) 23.