메뉴 건너뛰기




Volumn 7, Issue 4, 1999, Pages 297-303

Low-cost 320×240 uncooled IRFPA using conventional silicon IC process

Author keywords

Fill factor; Forward biased characteristics; PN junction diode; Silicon compatible process; SOI; Uncooled IRFPA

Indexed keywords


EID: 0000675174     PISSN: 12303402     EISSN: 18963757     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (18)

References (7)
  • 1
    • 0027867157 scopus 로고
    • Uncooled thermal imaging with monolithic silicon focal planes
    • R.A. Wood, "Uncooled thermal imaging with monolithic silicon focal planes", Proc. SPIE 2020, 322-329 (1993).
    • (1993) Proc. SPIE , vol.2020 , pp. 322-329
    • Wood, R.A.1
  • 2
    • 0027873637 scopus 로고
    • Uncooled thermal imaging at Texas Instruments
    • C. Hanson, "Uncooled thermal imaging at Texas Instruments", Proc. SPIE 2020, 330-339 (1993).
    • (1993) Proc. SPIE , vol.2020 , pp. 330-339
    • Hanson, C.1
  • 4
    • 38249014087 scopus 로고
    • Infrared linear image sensor using a poly-Si pn junction diode array
    • A. Tanaka, M. Suzuki, R. Asahi, R. Tabata, and S. Sugiyama, "Infrared linear image sensor using a poly-Si pn junction diode array", Infrared Phys. 33, 229-236 (1992).
    • (1992) Infrared Phys. , vol.33 , pp. 229-236
    • Tanaka, A.1    Suzuki, M.2    Asahi, R.3    Tabata, R.4    Sugiyama, S.5
  • 5
    • 0042747090 scopus 로고
    • 1/f noise in amorphous silicon nip and pin diodes
    • H. Wieczorek "1/f noise in amorphous silicon nip and pin diodes", J. Appl. Phys. 77, 3300-3307 (1995).
    • (1995) J. Appl. Phys. , vol.77 , pp. 3300-3307
    • Wieczorek, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.