A semiconductor YBaCuO microbolometer for room temperature IR imaging

IEEE Transactions on Electron Devices

Volumn 44, Issue 10, 1997, Pages 1795-1801

  Jahanzeb, Agha ^a   Travers, Christine M ^a   Çelik Butler, Zeynep ^a   Butler, Donald P ^a   Tan, Stephen G ^a  

^a Southern Methodist University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; IMAGE SENSORS; INFRARED IMAGING; PERFORMANCE; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS;

SEMICONDUCTING BOLOMETERS;

BOLOMETERS;

EID: 0031251538     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.628839     Document Type: Article

References (19)

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