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Volumn 22, Issue 11-12, 2000, Pages 1569-1579
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Automated grain boundary detection and classification in orientation contrast images
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL GRADIENTS;
ELECTRON BACKSCATTERING DIFFRACTION ANALYSIS;
MYLONITE;
STRESS FIELDS;
BACKSCATTERING;
CRYSTAL ORIENTATION;
CRYSTALLINE MATERIALS;
ELECTRON DIFFRACTION;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
MICROSCOPIC EXAMINATION;
ROCKS;
AUTOMATION;
GRAIN BOUNDARY;
IMAGE ANALYSIS;
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EID: 0034324802
PISSN: 01918141
EISSN: None
Source Type: Journal
DOI: 10.1016/S0191-8141(00)00084-5 Document Type: Conference Paper |
Times cited : (17)
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References (15)
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