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Volumn 22, Issue 11-12, 2000, Pages 1569-1579

Automated grain boundary detection and classification in orientation contrast images

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL GRADIENTS; ELECTRON BACKSCATTERING DIFFRACTION ANALYSIS; MYLONITE; STRESS FIELDS;

EID: 0034324802     PISSN: 01918141     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0191-8141(00)00084-5     Document Type: Conference Paper
Times cited : (17)

References (15)
  • 4
    • 0004025788 scopus 로고
    • Developments in the EBSD technique and their application to grain imaging
    • PhD Thesis, University of Bristol, Bristol, UK
    • (1993)
    • Day, A.1
  • 7
    • 0023163764 scopus 로고
    • Atomic number and crystallographic contrast images with the SEM: A review of backscattered electron techniques
    • (1987) Mineralogical Magazine , vol.51 , pp. 3-19
    • Lloyd, G.E.1
  • 13
    • 0004108252 scopus 로고    scopus 로고
    • Quantifying Microstructures-The development and application of a new technique to quartzitic shear zones
    • PhD Thesis, University of Liverpool, Liverpool, UK
    • Trimby, P.W.1
  • 15
    • 0030775904 scopus 로고    scopus 로고
    • Electron diffraction based techniques in scanning electron microscopy of bulk materials
    • (1997) Micron , vol.28 , Issue.4 , pp. 279-308
    • Wilkinson, A.J.1    Hirsch, P.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.