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Journal of Materials Science

Volumn 35, Issue 22, 2000, Pages 5575-5579

Thermomigration as a driving force for instability of electromigration induced mass transport in interconnect lines

(1) Ru, C Q a

a UNIVERSITY OF ALBERTA (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMIGRATION; FAILURE ANALYSIS; HEAT CONDUCTION; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; STRESSES; THERMAL DIFFUSION; THIN FILMS; TRANSPORT PROPERTIES;

ELECTROMIGRATION FAILURE; ELECTROMIGRATION INDUCED MASS TRANSPORT; INTERCONNECT LINES; THERMOMIGRATION;

ELECTRIC CONDUCTORS;

EID: 0034315310 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1023/A:1004852912392 Document Type: Article

Times cited : (38)

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