SCOPUS 정보 검색 플랫폼

Applied Surface Science

Volumn 166, Issue 1, 2000, Pages 341-345

Spatial distribution of Cd in CdSe/ZnSe superlattices studied by X-ray diffraction

(7) Kyutt, R N a Toropov, A A a Shubina, T V a Sorokin, S V a Ivanov, S V a Karlsteen, M b Willander, M b

a IOFFE INSTITUTE (Russian Federation)

b C ^* (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; MONOLAYERS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

FULL WIDTH AT HALF MAXIMUM (FWHM); SHORT-PERIOD SUPERLATTICES (SL);

SEMICONDUCTOR SUPERLATTICES;

EID: 0034300319 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(00)00446-3 Document Type: Article

Times cited : (5)

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