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Volumn 94, Issue 3, 1998, Pages 519-525

CdSe layers of below critical thickness in ZnSe matrix: Intrinsic morphology and defect formation

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Indexed keywords


EID: 0042476921     PISSN: 05874246     EISSN: None     Source Type: Journal    
DOI: 10.12693/APhysPolA.94.519     Document Type: Article
Times cited : (6)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.