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Volumn 219, Issue 3, 2000, Pages 205-217

Numerical study on the effect of operating parameters on point defects in a silicon crystal during Czochralski growth. I. Rotation effect

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL GROWTH FROM MELT; FLOW PATTERNS; POINT DEFECTS; ROTATION; SEMICONDUCTOR GROWTH;

EID: 0034298315     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00637-0     Document Type: Article
Times cited : (12)

References (21)
  • 17
    • 0001961825 scopus 로고
    • in: M. Stovola, S.J. Pearton, G. Davies (Eds.), Materials Research Society
    • F. Morehead, in: M. Stovola, S.J. Pearton, G. Davies (Eds.), Defects in Electronic Materials, Vol. 104, Materials Research Society, 1987, p. 99.
    • (1987) Defects in Electronic Materials , vol.104 , pp. 99
    • Morehead, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.