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Volumn 219, Issue 3, 2000, Pages 205-217
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Numerical study on the effect of operating parameters on point defects in a silicon crystal during Czochralski growth. I. Rotation effect
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
CRYSTAL GROWTH FROM MELT;
FLOW PATTERNS;
POINT DEFECTS;
ROTATION;
SEMICONDUCTOR GROWTH;
MAGNETIC CZOCHRALSKI PROCESS;
SEMICONDUCTING SILICON;
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EID: 0034298315
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(00)00637-0 Document Type: Article |
Times cited : (12)
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References (21)
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