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Volumn 165, Issue 4, 1996, Pages 362-371

Oxygen transport from a silica crucible in Czochralski silicon growth

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRUCIBLES; DISSOLUTION; HIGH TEMPERATURE EFFECTS; INTERFACES (MATERIALS); LIQUID METALS; OXYGEN; SILICA; SILICON; TRANSPORT PROPERTIES;

EID: 0030564755     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(96)00211-4     Document Type: Article
Times cited : (38)

References (17)
  • 2
    • 0041900001 scopus 로고
    • Eds. H.R. Huff, K.G. Barraclough and J. Chikawa Electrochem. Society, Pennington, NJ
    • K.M. Kim and W.E. Langlois, in; Semiconductor Silicon, Eds. H.R. Huff, K.G. Barraclough and J. Chikawa (Electrochem. Society, Pennington, NJ, 1990) p. 81.
    • (1990) Semiconductor Silicon , pp. 81
    • Kim, K.M.1    Langlois, W.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.