|
Volumn 464, Issue 1, 2000, Pages
|
Scaling properties of step bunches formed on vicinal crystal surfaces during MBE growth
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
ELECTROMIGRATION;
MOLECULAR BEAM EPITAXY;
MORPHOLOGY;
SINGLE CRYSTALS;
SURFACE ROUGHNESS;
ADATOMS;
STEP BUNCHING;
SILICON;
|
EID: 0034274877
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(00)00701-9 Document Type: Article |
Times cited : (9)
|
References (17)
|