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Volumn 370, Issue 2-3, 1997, Pages 345-354
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Current-induced step bunching at vicinal surfaces during crystal sublimation
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Author keywords
Faceting; Silicon; Sublimation; Surface diffusion; Surface morphology
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Indexed keywords
DIFFUSION;
ELECTRON TRANSPORT PROPERTIES;
INDUCED CURRENTS;
MATHEMATICAL MODELS;
MORPHOLOGY;
SILICON;
SUBLIMATION;
SURFACES;
ADATOMS;
FACETING;
STEP BUNCHING;
SURFACE DIFFUSION;
SURFACE PHENOMENA;
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EID: 0030734859
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(96)00966-1 Document Type: Article |
Times cited : (49)
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References (20)
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