Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy

Thin Solid Films

Volumn 372, Issue 1, 2000, Pages 94-103

  Solina, D M ^a   Cheary, R W ^a   Swift, P D ^a   Dligatch, S ^a   McCredie, G M ^a   Gong, B ^b   Lynch, P ^a  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (SPECIFIC GRAVITY); ELECTROMAGNETIC WAVE REFLECTION; ELECTRON BEAMS; EVAPORATION; MAGNETRON SPUTTERING; MULTILAYERS; PLATINUM; SPUTTER DEPOSITION; SURFACE STRUCTURE; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON BEAM EVAPORATION; X RAY REFLECTIVITY SPECTROSCOPY;

METALLIC FILMS;

EID: 0034274594     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01044-0     Document Type: Article

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