An analysis of Ag/Al2O3 angular selective films by X-ray reflectivity

Thin Solid Films

Volumn 312, Issue 1-2, 1998, Pages 4-6

  Dligatch, S ^a   Cheary, R W ^a   Smith, G B ^a  

^a NONE

Author keywords

Coatings; Deposition process; X ray

Indexed keywords

ALUMINA; DEPOSITION; FILM PREPARATION; SILVER; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

ANGULAR SELECTIVE FILMS; X RAY REFLECTIVITY MEASUREMENTS;

CERAMIC MATRIX COMPOSITES;

EID: 0031651327     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00334-9     Document Type: Letter

References (11)

1. H.G. Craighead, R.A. Buhrman, Appl. Phys. Lett. 31 (1997) 423.
2. G.A. Niklasson, C.G. Granqvist, J. Mater. Sci. 18 (1983) 3475.
3. G.B. Smith, S. Dligatch, M.W. Ng, Proc. SPIE 2531 (1995) 317.
4. G.B. Smith, M.W. Ng, R.J. Ditchburn, P.J. Martin, R.P. Netterfield, J. Sol. Energy Mater. 25 (1992) 149.
5. C. Schiller, G.M. Martin, W.W. van der Hoogenhof, J. Corno, Philips J. Res. 47 (1993) 217.
6. A. Gibaud, G. Vignaud, S.K. Sinha, Acta Crystallogr. A49 (1993) 642.
7. L.G. Parratt, Phys. Rev. 95 (1954) 359.
8. L. Nevot, P. Croce, Rev. Phys. Appl. 15 (1980) 761.
9. G.B. Smith, S. Dligatch, M.W. Ng, Proc. Window Inovations '95, A world conference on state-of-the art window technologies for energy efficiencies in buildings, Toronto, Canada. June 1995, Canadian Government, ISBN 0-660-16085-4.
10. K.L. Chopra, Thin Film Phenomena, Chap. 8, McGraw-Hill, New York, 1970.
11. G.B. Smith, G.A. Niklasson, J.S.E.M. Svensson, C.G. Granqvist, J. Appl. Phys. 59 (1986) 571.