Growth and Structure of Thin Pt2Si and PtSi Layers on Si(111) and (001) Characterized with in Situ Grazing Incidence Diffraction

Journal of Applied Crystallography

Volumn 30, Issue 6, 1997, Pages 1016-1021

  Kumpf, C ^a,b   Nicula, R ^c   Burkel, E ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b UNIVERSITY OF ROSTOCK   (Germany)

^c NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041919892     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897005815     Document Type: Article

References (16)

1. Bernard, N., Burkel, E., Gompper, G., Metzger, H., Peisl, J., Wagner, H. & Wallner, G. (1987). Z. Phys. B Condens. Matter, 69, 303-311.
2. Cabanski, W. & Schulz, M. (1991). Infrared Phys. 32, 29-44.
3. Czernik, A., Palm, H., Cabanski, W., Schulz, M. & Suckow, U. (1992). Appl. Phys. A55, 180-191.
4. Dosch, H. (1987). Phys. Rev. B, 35, 2137-2143.
5. Fitzsimmons, M. R. & Burkel, E. (1993). Phys. Rev. B, 47, 8436-8452.
6. Graeber, E. J., Baughman, R. J. & Morosin, B. (1973). Acta Cryst. B29, 1991-1994.
7. Kawarada, H., Ishida, M., Nakanishi, J., Ohdomari, I. & Horiuchi, S. (1986). Philos. Mag. A, 54, 729-741.
8. Lekner, J. (1987). Theory of Reflection. Dordrecht: Martinius Nijhoff Publishers.
9. Ley, L., Wang, Y., Van Nguyen, V., Fisson, S., Souche, D., Vuye, G. & Rivory, J. (1995). Thin Solid Films, 270, 561-566.
10. Pearson, W. B. (1986). Pearson's Handbook of Crystallographic Data for Intermetallic Phases, Vol. 1, p. 474, Vol. 3, p. 3050. American Society for Metals, Metals Park.
11. Pearson, W. B. (1986). Pearson's Handbook of Crystallographic Data for Intermetallic Phases, Vol. 1, p. 474, Vol. 3, p. 3050. American Society for Metals, Metals Park.
12. Schmiedl, R., Demuth, V., Lahnor, P., Godehardt, H., Bodschwinna, Y., Harder, C., Hammer, L., Strunk, H.-P., Schulz, M. & Heinz, K. (1996). J. Appl. Phys. A62, 223-230.
13. Schulz, M. & Strunk, H.-P. (1996). Personal communication.
14. Sinha, A. K., Marcus, R. B., Sheng, T. T. & Haszko, S. E. (1972). J. Appl. Phys. 43, 3637-3643.
15. Tsaur, B. Y., Weeks, M. M. & Pellegrini, P. W. (1988). IEEE Electron Device Lett. 9, 100-102.
16. Vineyard, G. H. (1982). Phys. Rev. B, 26, 4146-4159.