Conduction-band deformation effect on stress-induced leakage current

Solid-State Electronics

Volumn 44, Issue 9, 2000, Pages 1703-1706

  Duan, Xiaodong ^a   Yuan, J S ^b  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b University of Central Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE CURRENTS; SEMICONDUCTOR DEVICE MODELS;

STRESS-INDUCED LEAKAGE CURRENT;

CMOS INTEGRATED CIRCUITS;

EID: 0034274297     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00093-9     Document Type: Article

References (8)

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