Optoelectronic techniques for ultrafast device network analysis to 700 GHz

Optical and Quantum Electronics

Volumn 28, Issue 7, 1996, Pages 783-800

  Frankel, M Y ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CIRCUIT OSCILLATIONS; ELECTRIC LOSSES; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK ANALYZERS; ELECTRIC VARIABLES MEASUREMENT; ELECTROOPTICAL DEVICES; FIELD EFFECT TRANSISTORS; OPTIMIZATION; PERFORMANCE; SIGNAL PROCESSING;

BANDWIDTH COVERAGE; ELECTROOPTIC NETWORK ANALYZER; ELECTROOPTIC SAMPLING; HETEROJUNCTION FIELD EFFECT TRANSISTORS; OPTOELECTRONIC TECHNIQUES; SIGNAL GENERATION; TRANSMISSION LINE LOSSES; ULTRAFAST DEVICE NETWORK ANALYSIS; WIDEBAND SIGNAL MEASUREMENT;

OPTOELECTRONIC DEVICES;

EID: 0030192206     PISSN: 03068919     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00820149     Document Type: Article

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