Characterization of > 300 GHz transistors using a novel optoelectronic network analyzer

Springer Series in Chemical Physics

Volumn 63, Issue , 1998, Pages 194-196

  Sahri, Nabil ^a   Nagatsuma, Tadao ^a   Otsuji, Taiichi ^a   Shimizu, Naofumi ^a   Yaita, Makoto ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 26844497288     PISSN: 01726218     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-3-642-72289-9_58     Document Type: Article

References (4)

1. T. Enoki, H. Ito, K. Ikuta and Y. Ishii, in Proc. 1995 Int'l. Conf. on IPRM, 81, 1995.
2. T. Otsuji, K. Murata, T. Enoki and Y. Umeda, in Tech. Dig. IEEE GaAs IC Symp., 183, 1997.
3. M. Y. Frankel, in Opt. Quantum Electron. 28,783, 1996.
4. th Annual Research Conf., 164, 1997.