|
Volumn 8, Issue 3, 2001, Pages 271-274
|
Electronic properties of assembled islands of hydrogen-saturated silicon clusters on Si(111)-(7×7) surfaces studied by scanning tunneling spectroscopy
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DANGLING BONDS;
ELECTRONIC PROPERTIES;
HYDROGEN;
SCANNING;
SCANNING TUNNELING MICROSCOPY;
SILICON;
SPECTROSCOPY;
CHARACTERISTIC PEAKS;
CHARGE ACCUMULATION;
DISCRETE STATE;
MEASUREMENTS OF;
NANOMETER SIZE;
RESONANCE TUNNELING;
SCANNING TUNNELING SPECTROSCOPY;
SILICON CLUSTERS;
SILICON COMPOUNDS;
|
EID: 0034258290
PISSN: 14346060
EISSN: None
Source Type: Journal
DOI: 10.1007/s100530170108 Document Type: Article |
Times cited : (6)
|
References (20)
|