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Volumn 17, Issue 8, 2000, Pages

Sensors that can take the heat Part 3: Design techniques for high-temperature applications

(1)  Goetz, Jay a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTROMIGRATION; HIGH TEMPERATURE APPLICATIONS; INTEGRATED CIRCUIT LAYOUT; INTERFACES (COMPUTER); MOS DEVICES; THERMAL EFFECTS;

EID: 0034256243     PISSN: 07469462     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (14)
  • 4
    • 0009539165 scopus 로고    scopus 로고
    • Final Report, HiTeC Program Monitored by U.S. Air Force, Wright Laboratory, Conducted by the HiTeC Consortium (AlliedSignal, Boeing, Honeywell, Moog, Ormet, Parker, Rockwell, United Technologies, and The University of Maryland). Led by United Technologies Research Center, August
    • (1999)
  • 10
    • 0009529820 scopus 로고    scopus 로고
    • HITEN Report; London England
    • (1997)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.