Direct measurement of crosstalk between integrated differential circuits

IEEE Transactions on Microwave Theory and Techniques

Volumn 48, Issue 8, 2000, Pages 1410-1413

  Bockelman, David E ^a   Eisenstadt, William R ^b  

^a MOTOROLA INC   (United States)

^b University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC NETWORK TOPOLOGY; ELECTROMAGNETIC FIELD THEORY; INTERCONNECTION NETWORKS; SCATTERING PARAMETERS; SILICON WAFERS; SPURIOUS SIGNAL NOISE; TELECOMMUNICATION LINES;

INTEGRATED DIFFERENTIAL CIRCUITS; METAL GROUND PLANE; NETWORK MEASUREMENTS;

INTEGRATED CIRCUITS;

EID: 0034248704     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.859489     Document Type: Article

References (10)

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