Scanning probe microscopy of carbon nanotubes

Carbon

Volumn 36, Issue 5-6, 1998, Pages 697-700

  Hubler, U ^a   Jess, P ^a   Lang, H P ^a   Guntherodt H J ^a   Salvetat, J P ^b   Forro L ^b  

^a UNIVERSITY OF BASEL   (Switzerland)

^b EPFL   (Switzerland)

Author keywords

A. Carbon nanotubes; C. atomic force microscopy (AFM); C. scanning tunneling microscopy (STM)

Indexed keywords

EID: 0001651626     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0008-6223(98)00047-5     Document Type: Article

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