Enhanced instability in thin liquid films by improved compatibility

Physical Review Letters

Volumn 85, Issue 7, 2000, Pages 1432-1435

  Reiter, Günter ^a   Khanna, Rajesh ^a   Sharma, Ashutosh ^b  

^a INSTITUT DE CHIMIE DES SURFACES ET INTERFACES   (France)

^b INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT ANGLE; LIQUIDS; MOLECULAR STRUCTURE; MONOLAYERS; OPTICAL MICROSCOPY; ORGANIC POLYMERS; SILICON WAFERS; SURFACE ACTIVE AGENTS; SURFACE TENSION; THIN FILMS; VAN DER WAALS FORCES; WETTING;

BOUNDING FLUID; LONG RANGE INTERACTION; POLYDIMETHYLSILOXANE FILM; POLYDISPERSITY;

MOLECULAR DYNAMICS;

EID: 0034247576     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.1432     Document Type: Article

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