Growth of ultrathin nanostructured Ag films on Si(111) 7×7: A SPA-LEED study

Surface Science

Volumn 463, Issue 1, 2000, Pages 22-28

  Moresco, F ^a,b   Rocca, M ^b   Hildebrandt, T ^a   Henzler, M ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b UNIVERSITY OF GENOA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; DEPOSITION; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; MONOLAYERS; MORPHOLOGY; SILVER; SURFACE ROUGHNESS;

SPOT PROFILE ANALYSIS OF LOW ENERGY ELECTRON DIFFRACTION (SPA-LEED);

SEMICONDUCTING SILICON;

EID: 0034246708     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00536-7     Document Type: Article

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