Structure and electronic properties of epitaxial metallic monolayers

Surface Science

Volumn 438, Issue 1-3, 1999, Pages 178-184

  Henzler, M ^a   Pfennigtorf, O ^a   Lang, K ^a   Luer T ^a   Moresco, F ^a   Hildebrandt, T ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRONIC PROPERTIES; EPITAXIAL GROWTH; GRAIN SIZE AND SHAPE; LEAD; LOW ENERGY ELECTRON DIFFRACTION; MATHEMATICAL MODELS; METALLIC FILMS; SEMICONDUCTING SILICON; SILVER; SURFACE STRUCTURE; ULTRATHIN FILMS;

DRUDE MODEL; FILM THICKNESS; LEAD FILM; SILVER FILM; SPOT PROFILE ANALYSIS;

MONOLAYERS;

EID: 0033326681     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00568-3     Document Type: Article

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