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Volumn 4, Issue 3, 1997, Pages 489-500

Capabilities of LEED for defect analysis

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[No Author keywords available]

Indexed keywords


EID: 0031315405     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X9700047X     Document Type: Article
Times cited : (27)

References (48)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.