Characterization of (Ba0.65Sr0.35)(Ti0.65Zr0.35)O3 thin film

Materials Research Bulletin

Volumn 35, Issue 11, 2000, Pages 1755-1761

  Byun, Jae Dong ^a   Yoon, Jung Il ^a   Nahm, Sahn ^a   Kim, Jin Cheol ^a  

^a Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BARIUM COMPOUNDS; CERAMIC MATERIALS; CRYSTAL STRUCTURE; DECOMPOSITION; FERROELECTRICITY; LEAKAGE CURRENTS; MAGNETRON SPUTTERING; PERMITTIVITY; PEROVSKITE; SYNTHESIS (CHEMICAL); THIN FILMS;

METAL-ORGANIC DECOMPOSITION (MOD) METHOD;

DIELECTRIC FILMS;

EID: 0034240709     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(00)00390-1     Document Type: Article

References (7)

1. Kuroiwa T., Tsunemine Y., Horikawa T., Makita T., Tanimura J., Mikami N., Sato K. Jpn J Appl Phys. 33:1994;5187-5191.
2. Krupanidhi S.B., Peng C.-J. Thin Solid Films. 305:1997;144-156.
3. Shimada Y., Inoue A., Nasu T., Arita K., Nagano Y., et al. Jpn J Appl Phys. 35:1996;140-143.
4. Wu T.B., Wu C.M., Chen M.L. Appl Phys Lett. 69:1996;2659-2661.
5. Kamehara N., Tsukada M., Cross J.S., Kurihara K. J Ceram Soc Jpn. 105:1997;746-749.
6. I.-C. Ho, S.-L. Fu, J Mater Sci (1990) 4699.
7. Bhattacharya P., Komeda T., Park K., Nishioka Y. Jpn J Appl Phys. 32:1993;4103-4106.