Measurement of in-plane displacement fields by a spectral phase algorithm applied to numerical speckle photography for microtensile tests

EPJ Applied Physics

Volumn 11, Issue 2, 2000, Pages 131-145

  Poilane, C ^a   Lantz, E ^a   Tribillon, G ^a   Delobelle, P ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COPPER PLATING; CORRELATION METHODS; ELASTICITY; ELECTROPLATING; FAST FOURIER TRANSFORMS; INTERPOLATION; METALLIC FILMS; PHOTOGRAPHY; SPECKLE; STRAIN; THIN FILMS;

DOUBLE FAST FOURIER TRANSFORM METHOD; IN-PLANE DISPLACEMENT FIELDS; INTERCORRELATION METHOD; MICROTENSILE TESTS; NUMERICAL SPECKLE PHOTOGRAPHY; SPECTRAL PHASE ALGORITHM;

TENSILE TESTING;

EID: 0034238956     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2000154     Document Type: Article

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