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Journal of Materials Research

Volumn 15, Issue 7, 2000, Pages 1483-1489

Electrosynthesis and microstructural characterization of anodic Vox films

(5) Schreckenbach, J P a Butte, D a Marx, G a Johnson, B R b Kriven, W M b

a CHEMNITZ UNIVERSITY OF TECHNOLOGY (Germany)

b University of Illinois at Urbana Champaign (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CONDENSATION; CRYSTAL MICROSTRUCTURE; ELECTRIC FIELD EFFECTS; ELECTROLYTES; FILM GROWTH; MORPHOLOGY; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROSYNTHESIS;

THIN FILMS;

EID: 0034236076 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2000.0213 Document Type: Article

Times cited : (3)

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