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Fresenius' Journal of Analytical Chemistry

Volumn 363, Issue 2, 1999, Pages 211-214

Characterization of thin metastable vanadium oxide films by Raman spectroscopy

(4) Schreckenbach, Joachim P a Witke, Klaus b Butte, Diethard a Marx, Günter a

a CHEMNITZ UNIVERSITY OF TECHNOLOGY (Germany)

b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000038953 PISSN: 09370633 EISSN: None Source Type: Journal
DOI: 10.1007/s002160051175 Document Type: Article

Times cited : (17)

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