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Volumn 72, Issue 13, 2000, Pages 2690-2695

Chip-scale universal detection based on backscatter interferometry

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ANALYTIC METHOD; ARTICLE; CALIBRATION; CAPILLARY ELECTROPHORESIS; INTERFEROMETRY; MEASUREMENT; REFRACTION INDEX;

EID: 0034235971     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac000261r     Document Type: Article
Times cited : (71)

References (38)
  • 35
    • 0343488705 scopus 로고    scopus 로고
    • Unpublished results from Risø National Laboratory, Lynk, Denmark, June
    • Hui, XX; Bornhop, D. J. Unpublished results from Risø National Laboratory, Lynk, Denmark, June 1999.
    • (1999)
    • Hui, X.X.1    Bornhop, D.J.2
  • 37
    • 0343488704 scopus 로고    scopus 로고
    • U.S. Patent 5,325,170, 1994
    • Bornhop, D. J. U.S. Patent 5,325,170, 1994.
    • Bornhop, D.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.