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Volumn 18, Issue 4 II, 2000, Pages 1613-1618

Surface morphology analysis in correlation with crystallinity of CeO2(110) layers on Si(100) substrates

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; ELECTRON BEAMS; EPITAXIAL GROWTH; EVAPORATION; MORPHOLOGY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SILICON WAFERS; SURFACE STRUCTURE; THIN FILMS;

EID: 0034226197     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582395     Document Type: Article
Times cited : (4)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.