Sequential equivalence checking based on structural similarities

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 7, 2000, Pages 814-819

  Van Eijk, C A J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BENCHMARKING; COMPUTATIONAL METHODS; EQUIVALENCE CLASSES; FINITE AUTOMATA; INTEGRATED CIRCUIT TESTING; OPTIMIZATION; PROBLEM SOLVING;

BINARY DECISION DIAGRAM; FINITE STATE MACHINE VERIFICATION; SEQUENTIAL EQUIVALENCE CHECKING; STATE SPACE TRAVERSAL; STRUCTURAL SIMILARITY;

SEQUENTIAL CIRCUITS;

EID: 0034224829     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.851997     Document Type: Article

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