Static electronic properties on various surface orientations of Al crystal undergoing electromigration

Applied Surface Science

Volumn 159, Issue , 2000, Pages 167-173

  Iguchi, Keinosuke ^a   Tachibana, Akitomo ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ALUMINUM; COPPER; CRYSTAL ORIENTATION; ELECTROMIGRATION; ELECTRONIC PROPERTIES; QUANTUM THEORY; SEMICONDUCTOR DOPING;

MULLIKEN CHARGE;

VLSI CIRCUITS;

EID: 0034207143     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00111-2     Document Type: Article

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