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Volumn 448, Issue 1, 2000, Pages 290-293
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Structure study of thin cadmium and copper sulphide films by diffraction of synchrotron radiation
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Author keywords
[No Author keywords available]
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Indexed keywords
CADMIUM COMPOUNDS;
COPPER COMPOUNDS;
CRYSTAL STRUCTURE;
INTERFACES (MATERIALS);
LATTICE CONSTANTS;
PHASE COMPOSITION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SEMICONDUCTING SILICON;
SUBSTRATES;
SYNCHROTRON RADIATION;
X RAY DIFFRACTION ANALYSIS;
CADMIUM SULFIDE;
COPPER SULFIDE;
REMOTE PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SYNCHROTRON RADIATION DIFFRACTION;
THIN FILMS;
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EID: 0034206839
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(00)00229-1 Document Type: Article |
Times cited : (7)
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References (14)
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