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Volumn 448, Issue 1, 2000, Pages 290-293

Structure study of thin cadmium and copper sulphide films by diffraction of synchrotron radiation

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; COPPER COMPOUNDS; CRYSTAL STRUCTURE; INTERFACES (MATERIALS); LATTICE CONSTANTS; PHASE COMPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING SILICON; SUBSTRATES; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

EID: 0034206839     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00229-1     Document Type: Article
Times cited : (7)

References (14)
  • 11
    • 85031557576 scopus 로고
    • JCPDS International Center for Diffraction Data, USA, 61, card N 03143
    • JCPDS International Center for Diffraction Data, 1988, USA, 61, card N 03143.
    • (1988)
  • 12
    • 85031561619 scopus 로고
    • JCPDS International Center for Diffraction Data, USA, 10, card N 454
    • JCPDS International Center for Diffraction Data, 1988, USA, 10, card N 454.
    • (1988)
  • 13
    • 85031566414 scopus 로고
    • JCPDS International Center for Diffraction Data, USA, V.24, card N 57a
    • JCPDS International Center for Diffraction Data, 1988, USA, V.24, card N 57a.
    • (1988)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.