STM measurement of current-potential curves at a semiconductor surface

Electrochimica Acta

Volumn 45, Issue 20, 2000, Pages 3213-3223

  Hiesgen, R ^a   Krause, M ^b   Meissner, D ^c  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

^c JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ENERGY GAP; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS;

TUNGSTEN SELENIDE;

PHOTOELECTRIC CELLS;

EID: 0034206540     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(00)00425-4     Document Type: Article

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