Nanoscale semiconductor interface characterization by photo-STM

Advanced Materials

Volumn 10, Issue 8, 1998, Pages 619-623

  Hiesgen, R ^a   Meissner, D ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC SPACE CHARGE; ELECTRONIC PROPERTIES; INTERFACES (MATERIALS); PHOTOELECTRICITY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR JUNCTIONS;

PHOTOVOLTAGE IMAGES;

SEMICONDUCTOR MATERIALS;

EID: 0032474332     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4095(199805)10:8<619::AID-ADMA619>3.0.CO;2-D     Document Type: Article

References (19)