Nanoscale characterization of semiconductor surfaces by spatially resolved photocurrent measurements

Fresenius' Journal of Analytical Chemistry

Volumn 358, Issue 1-2, 1997, Pages 54-58

  Hiesgen, Renate ^a   Meissner, Dieter ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003291269     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050344     Document Type: Article

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