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Volumn 35, Issue 11, 1996, Pages 5909-5913

Localized fluctuation of a two-dimensional atomic-scale friction

Author keywords

Atomic scale friction; Cleaved graphite surface; Effective adhesive area; Localized fluctuation; Subangstrom lateral resolution; Two dimensional frictional force microscope; Two dimensional stick slip model

Indexed keywords

ATOMIC SCALE FRICTION; FRICTIONAL FORCE MICROSCOPE; LOCALIZED FLUCTUATION;

EID: 0030290452     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.5909     Document Type: Article
Times cited : (9)

References (10)
  • 9
    • 3342936612 scopus 로고    scopus 로고
    • Olympus Optical Co., Ltd., 2951 Ishikawacho Hachioji, 192 Japan
    • Olympus Optical Co., Ltd., 2951 Ishikawacho Hachioji, 192 Japan.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.