Contact and non-contact mode imaging by atomic force microscopy

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 138-142

  Morita, Seizo ^a   Fujisawa, Satoru ^a   Kishi, Eigo ^a   Ohta, Masahiro ^a   Ueyama, Hitoshi ^a   Sugawara, Yasuhiro ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy

Indexed keywords

FRICTION; IMAGING TECHNIQUES; INTERFEROMETERS; MICROSCOPES; NONDESTRUCTIVE EXAMINATION; SEMICONDUCTING INDIUM PHOSPHIDE; SURFACES;

ATOMIC FORCE LATERAL FORCE MICROSCOPE; ATOMIC FORCE MICROSCOPE; ATOMIC SCALE CORRUGATION MICROSCOPE; ATOMIC SCALE FRICTION; LATTICE PERIODICITY; OPTICAL INTERFEROMETER METHOD; OPTICAL LEVER DEFLECTION METHOD; TWO DIMENSIONAL DISCRETE FRICTION; TWO DIMENSIONAL FRICTIONAL FORCE MICROSCOPE; TWO DIMENSIONAL STICK SLIP MODEL;

ATOMIC FORCE MICROSCOPY;

EID: 0030080492     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06806-6     Document Type: Article

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