Atomic force microscopy improved resolution employing large scanning speeds: Effects of the double relaxation time

Review of Scientific Instruments

Volumn 69, Issue 10, 1998, Pages 3588-3592

  Teschke, O ^a   Souza, E F ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005813811     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149143     Document Type: Article

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