메뉴 건너뛰기




Volumn 49, Issue 6, 2000, Pages 560-574

Self-checking detection and diagnosis of transient, delay, and crosstalk faults affecting bus lines

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; ELECTRIC FAULT CURRENTS; MICROPROCESSOR CHIPS;

EID: 0034204994     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.862216     Document Type: Article
Times cited : (54)

References (29)
  • 1
    • 0008526186 scopus 로고    scopus 로고
    • Scaling Deeper to Submicron: On-Line Testing to theRescue
    • M. Nicolaidis, "Scaling Deeper to Submicron: On-Line Testing to theRescue," Proc. IEEE Int'l Test Conf., p. 1,139, 1998.
    • (1998) Proc. IEEE Int'l Test Conf.
    • Nicolaidis, M.1
  • 2
    • 0032317504 scopus 로고    scopus 로고
    • On-Line Detection of Logic Errors Due to Crosstalk, Delay, and Transient Faults
    • C. Metra, M. Favalli, and B. Riccò, "On-Line Detection of Logic Errors Due to Crosstalk, Delay, and Transient Faults," Proc. IEEE Int'l Test Conf., pp. 524-533, 1998.
    • (1998) Proc. IEEE Int'l Test Conf. , pp. 524-533
    • Metra, C.1    Favalli, M.2    Riccò, B.3
  • 3
    • 0003635036 scopus 로고
    • D.K. Pradhan, ed. Englewood Cliffs, N.J.: Prentice Hall Int'l
    • Fault Tolerant Computing: Theory and Techniques, D.K. Pradhan, ed. Englewood Cliffs, N.J.: Prentice Hall Int'l, 1986.
    • (1986) Fault Tolerant Computing: Theory and Techniques
  • 6
    • 0031175881 scopus 로고    scopus 로고
    • On-Line Detection of Bridging and Delay Faults in Functional Blocks of CMOS Self-Checking Circuits
    • July
    • C. Metra, M. Favalli, P. Olivo, and B. Riccò, "On-Line Detection of Bridging and Delay Faults in Functional Blocks of CMOS Self-Checking Circuits," IEEE Trans. Computer-Aided Design, vol. 16, pp. 770-776, July 1997.
    • (1997) IEEE Trans. Computer-Aided Design , vol.16 , pp. 770-776
    • Metra, C.1    Favalli, M.2    Olivo, P.3    Riccò, B.4
  • 7
    • 0001354010 scopus 로고
    • A Novel Area-Time Efficient Static CMOS Totally Self-Checking Comparator
    • Feb.
    • J.C. Lo, "A Novel Area-Time Efficient Static CMOS Totally Self-Checking Comparator," IEEE J. Solid State Circuits, vol. 28, pp. 165-168, Feb. 1993.
    • (1993) IEEE J. Solid State Circuits , vol.28 , pp. 165-168
    • Lo, J.C.1
  • 8
    • 0026120433 scopus 로고
    • Crosstalk and Transient Analysis of High-Speed Interconnects and Packages
    • Mar.
    • H. You and M. Soma, "Crosstalk and Transient Analysis of High-Speed Interconnects and Packages," IEEE J. Solid State Circuits, vol. 26, pp. 319-329, Mar. 1991.
    • (1991) IEEE J. Solid State Circuits , vol.26 , pp. 319-329
    • You, H.1    Soma, M.2
  • 9
    • 0000670599 scopus 로고
    • Methodology of Detection of Spurious Signals in VLSI Circuits
    • F. Moll and A. Rubio, "Methodology of Detection of Spurious Signals in VLSI Circuits," Proc. European Design and Test Conf., pp. 491-496, 1993.
    • (1993) Proc. European Design and Test Conf. , pp. 491-496
    • Moll, F.1    Rubio, A.2
  • 12
    • 0031354479 scopus 로고    scopus 로고
    • Analytic Models for Crosstalk Delay and Pulse Analysis under Non-Ideal Inputs
    • W. Chen, S.K. Gupta, and M.A. Brueur, "Analytic Models for Crosstalk Delay and Pulse Analysis under Non-Ideal Inputs," Proc. IEEE Int'l Test Conf., pp. 809-818, 1997.
    • (1997) Proc. IEEE Int'l Test Conf. , pp. 809-818
    • Chen, W.1    Gupta, S.K.2    Brueur, M.A.3
  • 14
    • 0032691273 scopus 로고    scopus 로고
    • Bus Crosstalk Fault Detection Capabilities of Error Detecting Codes for On-Line Testing
    • Sept.
    • M. Favalli and C. Metra, "Bus Crosstalk Fault Detection Capabilities of Error Detecting Codes for On-Line Testing," IEEE Trans. VLSI Systems, vol. 7, pp. 392-396, Sept. 1999.
    • (1999) IEEE Trans. VLSI Systems , vol.7 , pp. 392-396
    • Favalli, M.1    Metra, C.2
  • 15
    • 0029713578 scopus 로고    scopus 로고
    • Embedded Two-Rail Checkers with On-Line Testing Ability
    • C. Metra, M. Favalli, and B. Riccò, "Embedded Two-Rail Checkers with On-Line Testing Ability," Proc. IEEE VLSI Test Symp., pp. 145-150, 1996.
    • (1996) Proc. IEEE VLSI Test Symp. , pp. 145-150
    • Metra, C.1    Favalli, M.2    Riccò, B.3
  • 16
    • 0017982079 scopus 로고
    • Strongly Fault-Secure Logic Networks
    • June
    • J.E. Smith and G. Metze, "Strongly Fault-Secure Logic Networks," IEEE Trans. Computers, vol. 27, no. 6, pp. 491-499, June 1978.
    • (1978) IEEE Trans. Computers , vol.27 , Issue.6 , pp. 491-499
    • Smith, J.E.1    Metze, G.2
  • 18
    • 0030679068 scopus 로고    scopus 로고
    • Highly Testable and Compact Single Output Comparator
    • C. Metra, M. Favalli, and B. Riccò, "Highly Testable and Compact Single Output Comparator," Proc. IEEE VLSI Test Symp., pp. 210-215, 1997.
    • (1997) Proc. IEEE VLSI Test Symp. , pp. 210-215
    • Metra, C.1    Favalli, M.2    Riccò, B.3
  • 20
    • 0030104425 scopus 로고    scopus 로고
    • Sensing Circuit for On-Line Detection of Delay Faults
    • Mar.
    • M. Favalli and C. Metra, "Sensing Circuit for On-Line Detection of Delay Faults," IEEE Trans. VLSI Systems, vol. 4, pp. 130-133, Mar. 1996.
    • (1996) IEEE Trans. VLSI Systems , vol.4 , pp. 130-133
    • Favalli, M.1    Metra, C.2
  • 22
    • 0028429979 scopus 로고
    • Fault Secure Property versus Strongly Code Disjoint Checkers
    • May
    • M. Nicolaidis, "Fault Secure Property versus Strongly Code Disjoint Checkers," IEEE Trans. Computer-Aided Design, vol. 13, no. 5, pp. 651-658, May 1994.
    • (1994) IEEE Trans. Computer-Aided Design , vol.13 , Issue.5 , pp. 651-658
    • Nicolaidis, M.1
  • 24
    • 0024124693 scopus 로고
    • Extraction and Simulation of Realistic CMOS Faults Using Inductive Fault Analysis
    • F.J. Ferguson and J.P. Shen, "Extraction and Simulation of Realistic CMOS Faults Using Inductive Fault Analysis," Proc. IEEE Int'l Test Conf., pp. 475-484, 1988.
    • (1988) Proc. IEEE Int'l Test Conf. , pp. 475-484
    • Ferguson, F.J.1    Shen, J.P.2
  • 25
    • 0023174388 scopus 로고
    • Optimal Layout to Avoid Stuck-Open Faults
    • S. Koeppe, "Optimal Layout to Avoid Stuck-Open Faults," Proc. Design Automation Conf., pp. 829-835, 1987.
    • (1987) Proc. Design Automation Conf. , pp. 829-835
    • Koeppe, S.1
  • 26
    • 0029251170 scopus 로고
    • Design of CMOS Checkers with Improved Testability of Bridging and Transistor Stuck-on Faults
    • Feb.
    • C. Metra, M. Favalli, P. Olivo, and B. Riccò, "Design of CMOS Checkers with Improved Testability of Bridging and Transistor Stuck-on Faults," J. Electronic Testing: Theory and Application, vol. 6, pp. 7-22, Feb. 1995.
    • (1995) J. Electronic Testing: Theory and Application , vol.6 , pp. 7-22
    • Metra, C.1    Favalli, M.2    Olivo, P.3    Riccò, B.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.