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Volumn 159, Issue , 2000, Pages 134-137
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Orientation dependence of ferroelectric properties of Pb(ZrxTi1-x)O3 thin films on Pt/SiO2/Si substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
FERROELECTRIC MATERIALS;
LASER ABLATION;
LEAD COMPOUNDS;
PLATINUM;
RAPID THERMAL ANNEALING;
SILICA;
SILICON;
SUBSTRATES;
THIN FILMS;
PYROCLORE STRUCTURES;
DIELECTRIC FILMS;
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EID: 0034204702
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(00)00129-X Document Type: Article |
Times cited : (4)
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References (8)
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