메뉴 건너뛰기




Volumn 159, Issue , 2000, Pages 134-137

Orientation dependence of ferroelectric properties of Pb(ZrxTi1-x)O3 thin films on Pt/SiO2/Si substrates

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; FERROELECTRIC MATERIALS; LASER ABLATION; LEAD COMPOUNDS; PLATINUM; RAPID THERMAL ANNEALING; SILICA; SILICON; SUBSTRATES; THIN FILMS;

EID: 0034204702     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00129-X     Document Type: Article
Times cited : (4)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.