Optical properties of lead lanthanum zirconate titanate amorphous thin films

Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

Volumn 19, Issue 3, 2000, Pages 202-204

  Li, Hui Qiu ^a   Zhang, Yue Li ^b   Wen, Jin Hui ^a   Yang, Sheng Hong ^b   Mo, Dang ^a   Xu, Yu Huan ^b   Mackenize, J D ^a  

^a SUN YAT SEN UNIVERSITY   (China)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Ellipsometry; Optical constants; Plzt amorphous film

Indexed keywords

LEAD COMPOUNDS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SOL-GELS;

EXTINCTION COEFFICIENT; OPTICAL CONSTANT;

AMORPHOUS FILMS;

EID: 0034200127     PISSN: 10019014     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

1. Land C, Thacher P, Haertling G. Electrooptic Ceramics, New York: Academic Press. ,1974,4: 137-233
2. Nakagawa T, Yamaguchi J, Usuki T, et al. Ferroelectric properties of RF sputtered PLZT thin film, Japan. J. Appl. Phys. ,1979,18: 896
3. Krumins A, Fritsberg V. Semiconductor properties and general applications of optical ceramics, Ferroelectrics, 1981,35: 149
4. Guto-Nelle A, Schichl H, Springer J. New transparent ceramics for electro-optical applications, Ferroelectrics, 1983,49: 151
5. Meng Z, Kumar U, Cross L. Electrostriction in lead lanthanum zirconate-titanate ceramics, J, Am. Ceram. Soc. , 1985,68: 459
6. 3 prepared by sol-gel technique, J. Non-Cryst. Solids. ,1994,176:1
7. 3 films on sapphire and Pt-coated silicon substrates, Thin Solid Films, 1993,230: 15
8. Trolier-McKinstry S, Chen J, Vedam K, et al. In situ annealing studies of sol-gel ferroelectric thin films by spectroscopic ellipsometry, J. Am. Ceram. Soc. , 1995, 78: 1907
9. Mo Dang, Li Q J, Zhu D R, et al. Ellipsometric spectra and optical constants of PLZT thin films, Ferroelectrics, 1999,229: 123
10. Xu Y H, Mackenzie J D. Ferroelectric thin films prepared by sol-gel processing, Integrated Ferroelectrics, 1992,1: 17
11. Kittel C. Introduction to Solid State Physics, 6th edition, New York : Wiley, 1986, 292-294
12. Azzam R M A, Bashara N M. Ellipsometry and Polarized Light, Amsterdam: North-Holland, 1977, 186-190
13. MO Dang. Solid State Optics, Beijing: Higher Education Press(),1996, 136-138
14. ZHU De-Rui, L AI Tian-Shu, LI Qiu-Jun, et al. High precision automatic ellipsometer, Acta Sci. Nature. Univ. Sunyatsent (), 1997,36 (4):31
15. LI Qiu-Jun, Mo Dang. Data analysis for spectroscopic ellipsometry with piecewise polynomial method, Acta Sci. Nature Univ. Sunyatsent(),1998,37(6):35
16. Haertling G H. PLZT electrooptic materials and applications-a review, Ferroelectrics, 1987, 75: 25