Ellipsometric spectra and optical constants of PLZT thin films

Ferroelectrics

Volumn 229, Issue 1-4, 1999, Pages 123-130

  Mo, Dang ^a   Li, Qiujun ^a   Zhu, Derui ^a   Li, Huiqiu ^a   Zhang, Yueli ^a   Tang, Zhenfang ^a   Liu, Yi ^a   Wong, S P ^b   Xu, Yuhuan ^c   Mackenzie, J D ^c  

^a SUN YAT SEN UNIVERSITY   (China)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^c Engineering IV   (United States)

Author keywords

Ellipsometry; Ferroelectric films; Optical constants

Indexed keywords

EID: 0141780370     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199908224328     Document Type: Article

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