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Journal of Materials Research

Volumn 15, Issue 5, 2000, Pages 1062-1068

Abnormal grain growth of sputtered CuNi(Mn) thin films

(5) Bruckner W a Weihnacht, V a Pitschke, W a Thomas, J a Baunack, S a

a IFW DRESDEN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COPPER COMPOUNDS; DENSIFICATION; GRAIN GROWTH; SCANNING ELECTRON MICROSCOPY; SPUTTERING; STRESS RELAXATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

PLASTIC STRESS RELAXATION;

THIN FILMS;

EID: 0034190854 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2000.0153 Document Type: Article

Times cited : (3)

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