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Volumn 204-206, Issue PART 1, 1996, Pages 99-108
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In-situ observations of grain boundary migration
a a a b a |
Author keywords
Bicrystals; Grain Boundary Migration; HRTEM; Impurity Drag; Mobility; Mobility Enhancement; Orientation Dependence; Thin Films; XICTD
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Indexed keywords
COMPOSITION EFFECTS;
CRYSTAL IMPURITIES;
CRYSTAL ORIENTATION;
ENTHALPY;
MASS TRANSFER;
THERMAL EFFECTS;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY ANALYSIS;
ACTIVATION ENTHALPY;
BICRYSTALS;
DRIVING FORCES;
GRAIN BOUNDARY MIGRATION;
GRAIN BOUNDARY MOBILITY;
IMPURITY DRAG;
MOBILITY ENHANCEMENT;
PREEXPONENTIAL MOBILITY FACTOR;
X RAY INTERFACE CONTINUOUS TRACKING DEVICE;
GRAIN BOUNDARIES;
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EID: 0029695131
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.204-206.99 Document Type: Article |
Times cited : (14)
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References (24)
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