Scanning near-field cathodoluminescence microscopy on indented MgO crystal

Surface and Interface Analysis

Volumn 27, Issue 5, 1999, Pages 495-498

  Pastre D ^a   Troyon, M ^a   Duvaut, T ^a   Beaudoin, J L ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; IMAGE PROCESSING; MAGNESIA; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; SCANNING ELECTRON MICROSCOPY; VICKERS HARDNESS TESTING;

INDENTATION; SCANNING NEAR FIELD CATHODOLUMINESCENCE MICROSCOPY; SLIP BANDS;

SINGLE CRYSTALS;

EID: 0032677523     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199905/06)27:5/6<495::aid-sia485>3.0.co;2-i     Document Type: Article

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