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Volumn 18, Issue 3, 2000, Pages 882-890

Mass-resolved ion energy distributions in continuous dual mode microwave/radio frequency plasmas in argon and nitrogen

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; IONS; NITROGEN; PHOTONS; PLASMA DENSITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PLASMA SHEATHS;

EID: 0034187139     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582271     Document Type: Article
Times cited : (37)

References (24)
  • 5
    • 84866858630 scopus 로고    scopus 로고
    • edited by P. F. Williams Kluwer, The Netherlands
    • J. Perrin, in Plasma Processing of Semiconductors, edited by P. F. Williams (Kluwer, The Netherlands, 1997), p. 397.
    • (1997) Plasma Processing of Semiconductors , pp. 397
    • Perrin, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.