Plasma diagnostics for surface modification of polymers

Surface and Coatings Technology

Volumn 98, Issue 1-3, 1998, Pages 1565-1571

  Meichsner, J ^a   Zeuner, M ^a   Krames, B ^a   Nitschke, M ^a   Rochotzki, R ^a   Barucki, K ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Ellipsometry; Energy selective mass spectrometry; FTIR spectroscopy; Langmuir probe measurements; Optical spectroscopy; Plasma; Plasma diagnostics; Polymer

Indexed keywords

EID: 0000336490     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(97)00298-3     Document Type: Article

References (14)

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